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Fast & Flexible: ADLINK’s Customized Solutions for Efficient Wafer Testing
Optimize IC Testing with ADLINK – Faster, Smarter, Better
Accelerate Efficiency with High-Density Digital I/O Solutions
Efficient IC testing requires handling high volumes and precise parameters measurement such as temperature, power consumption, and load. ADLINK’s digital I/O solutions ensure fast and reliable data relay to IC sorter, handler, and temperature control systems for seamless processing.
Unleash the Capabilities of ADLINK’s Digital I/O Solutions
Rapid and Customized Solutions
Incorporated into proprietary protocol such as Serial Peripheral Interface (SPI) in 2 weeks with ADLINK device management utility (MAPS)
Fit for High-Volume Testing
Achieve up to 200 MB/s throughput with high-density and high-speed modules
Pre-configured for IPC Integration
Ensure smooth interaction between the IPC and digital I/O, enhancing system stability and productivity.
One-Stop for Digital I/O and IPC
PCIe-7350
50 MHz 10-CH High-Speed Digital I/O card
RK-620
4U Rack Mounted
